Design for Testability

We offers comprehensive design for testability (DFT) solutions for complex semiconductor designs. With a deep understanding of DFT methodologies and cutting-edge tools, we develop optimized DFT architectures to achieve maximum test coverage and reduced test time. Our expertise encompasses all aspects of DFT, including physical implementation, timing closure, physical verification, library generation, and characterization support.

We leverage the latest technologies and tools, such as FinFET libraries, low power concepts, custom clock tree design, and CLP/MVRC checks. Our successful track record includes delivering DFT solutions for demanding designs like mobile GPU high-speed cores, CPU/GPU core/unit/block level, IoT/networking/connectivity programs, and library development.

PRE & POST VALIDATION

Emulation SLE/FPGA

  • SOC And Board Bring up
  • SOC Power ON
  • IP Functional Validation
  • Analog mixed signal Val
  • Pre / Post si correlations
  • System level validation
  • BIOS/BSP OS driver development
  • Test Plan and content development
  • Pre / Post si correlations